PPP-SEIHR | ||||
Point Probe¢ç Plus SEIKO microscopes - Non-contact / Tapping™mode High force constant - Reflex coating | ||||
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ÀçÇö¼ºÀ» Á¦°øÇϰí ÀÖ½À´Ï´Ù. ¡¡ Seiko Instruments microscope ÀÇ ³ÄÜÅØ¸ðµå »ç¿ë½Ã¿¡ NANOSENSORSÀÇ PPP-SEIHR ŸÀÔ(Seiko Instruments / high force constant)ÀÌ À¯¿ëÇÕ´Ï´Ù. ZEIHR ¼¾¼¿¡ ºñÇÏ¿© force constant °¡ ÈξÀ Àû½À´Ï´Ù. ¹Ý»ç¸éÀº ¾Ë·ç¹Ì´½ ÄÚÆÃ(Reflex Coating) ÀÌ µÇ¾î ÀÖ½À´Ï´Ù. ¡¡ ¹Ý»ç¸éÀ» ·¹ÀÌÀúºöÀÇ ¹Ý»çµµ¸¦ 2.5 Factor ±îÁö Áõ°¡½Ã۱â À§ÇÏ¿© ¾à 30 nm µÎ²²ÀÇ ¾Ë·ç¹Ì´½À¸·Î ÄÚÆÃÀ» ÇÏ¿´½À´Ï´Ù. ÀÌ·¸°Ô ÇÔÀ¸·Î¼ ºûÀÌ ÄµÆ¼·¹¹ö³»·Î °£¼·µÇ´Â °ÍÀ» ¹æÁöÇÏ¿´½À´Ï´Ù. ÀÌ ÄÚÆÃÀº ĵƼ·¹¹ö¸¦ Á¶±Ý¹Û¿¡ ¹êµùÀ» ½ÃŰÁö ¾Ê½À´Ï´Ù. ¼öÁ÷ ¹æÇâÀ¸·Î ÈÚÀ» ¹æÁö¸¦ À§ÇÑ ÄÚÆÃÀÌ µÇ¾î ÀÖ¾î ¹êµùÀº ĵƼ·¹¹ö ±æÀÌÀÇ 2% À̳»ÀÔ´Ï´Ù. ¡¡ | ||||
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Typical Value |
Specified Values |
Thickness /µm |
5 |
4.0 - 6.0 |
Mean Width /µm |
33 |
25-40 |
Length /µm |
225 |
215 - 235 |
Force Constant /(N/m) |
15 |
5-37 |
Resonance Frequency /kHz |
130 |
96-175 |
´õ ¸¹Àº Á¤º¸°¡ ÇÊ¿äÇϸé ÀϹݼ³¸í , SuperSharpSilicon ¼¾¼ ÀÇ ¼³¸í, High Aspect Ratio ¼¾¼ ÀÇ ¼³¸í, ±×¸®°í Diamond Coated ¼¾¼ ÀÇ ¼³¸íÀ» Âü°íÇÏ½Ã¸é µË´Ï´Ù. |
PPP-SEIHR ´Â ´ÙÀ½ ÇüÅÂÀÇ ¼±Àû ´ÜÀ§°¡ ÀÖ½À´Ï´Ù.. |
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ÁÖ¹® ÄÚµå |
Æ÷Àå´ÜÀ§ |
Data Sheet |
ÄÚÆÃ |
PPP-SEIHR-10# |
10 |
¸ðµç ¼¾¼ | ¹Ý»ç¸é |
PPP-SEIHR-20# |
20 |
¸ðµç ¼¾¼ | ¹Ý»ç¸é |
PPP-SEIHR-50 | 50 | ¾øÀ½ | ¹Ý»ç¸é |
PPP-SEIHR-W* | > 380 | 32°³ ¼¾¼±îÁö | ¹Ý»ç¸é |